SPECIFICATIONS:
SEM (Carl Zeiss , Neon 40) |
Resolution : 1.1nm @ 20 kv , 2.5nm @1kv Probe current : 4pA - 20nA Accelerating Voltage : 0.1 - 30kv |
FIB (Orsay Physics) |
Resolution :7nm @ 30kv (maximum ) ,5nm Probe current : 1pA - 50nA Accelerating Voltage : 2 - 30 kv Seven Aperture positions : 10 um , 20 um, 2x50 um, 100 um, 200 um, 400 um . |
Vacum System |
Ion getter pump , Turbo molecular pump with oil free Rotary pump |
Specimen Stage |
6-axes fully Eucentric , all motorised X= 100mm , Y= 100mm , Z=43mm , Z'=10mm Tilt = -10 to – 60 deg. motorised , Rotation = 360 deg. continious motorised |
Detectors |
STEM detector , Four Quadrant Back scattered electron detector (Carl Zeiss ) & EDS detector (INCA, Oxford) |
Gas injection system (GIS, Orsay Physics) |
For 5 Gases (Xenon Difluoride, Tungsten, Platinum, water, SiO2) |
Micromanipulator (Kleindiek) |
For TEM lamella Preparation |